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Electronics

Component Modeling and measurement short course

morreale Thursday 03 of April, 2014
Agilent Technologies now Keysight Technologies hosted a short course covering
  • Component modeling and measurement,
  • Circuit design and analysis, and
  • System modeling
on April 2, 2014. The course was taught by
  • Venkatesh Balasubramanian from Maury Microwave Corp
  • Roberto Tiniti from Agilent Technologies
  • Murthy Upmaka from Agilent Technologies
  • Richard Hoft from Agilent Technologies
and covered five topics including
  • Pulsed IV/RF Measurements for compact model extraction
  • Amplifier Design Flow
  • VNA and NVNA Load Pull for Model Validation
  • Amplifier Design in ADA
  • Innovation in Nonlinear Measurements and Simulation using X-Parameters
This was a great short course. The instructors lead you trough the process of amplifier design with model extraction, test, verification using a PNA, PNA-X, and augmented PNAs for nonlinear model extraction. The introduction to x-parameters was well done and is a powerful extension to s-parameters.

Photo of the Agilent Technologies PNA Model Extraction test set.